Optical thermometry based on level anticrossing in silicon carbide

We report a giant thermal shift of 2.1 MHz/K related to the excited-state zero-field splitting in the silicon vacancy centers in 4H silicon carbide. It is obtained from the indirect observation of the optically detected magnetic resonance in the excited state using the ground state as an ancilla. Al...

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Bibliographic Details
Published in:Scientific reports 2016-09, Vol.6 (1), p.33301-33301, Article 33301
Main Authors: Anisimov, A N, Simin, D, Soltamov, V A, Lebedev, S P, Baranov, P G, Astakhov, G V, Dyakonov, V
Format: Article
Language:English
Subjects:
Luminescence
Optically detected magnetic resonance
Photons
Silicon
Silicon carbide
Splitting
Temperature
Temperature effects
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Summary:We report a giant thermal shift of 2.1 MHz/K related to the excited-state zero-field splitting in the silicon vacancy centers in 4H silicon carbide. It is obtained from the indirect observation of the optically detected magnetic resonance in the excited state using the ground state as an ancilla. Alternatively, relative variations of the zero-field splitting for small temperature differences can be detected without application of radiofrequency fields, by simply monitoring the photoluminescence intensity in the vicinity of the level anticrossing. This effect results in an all-optical thermometry technique with temperature sensitivity of 100 mK/Hz(1/2) for a detection volume of approximately 10(-6) mm(3). In contrast, the zero-field splitting in the ground state does not reveal detectable temperature shift. Using these properties, an integrated magnetic field and temperature sensor can be implemented on the same center.
ISSN:2045-2322
2045-2322
DOI:10.1038/srep33301