Solvent-dependent self-assembly of two dimensional layered perovskite (C 6 H 5 CH 2 CH 2 NH 3 ) 2 MCl 4 (M = Cu, Mn) thin films in ambient humidity

Two dimensional layered organic-inorganic halide perovskites offer a wide variety of novel functionality such as solar cell and optoelectronics and magnetism. Self-assembly of these materials using solution process (ex. spin coating) makes crystalline thin films synthesized at ambient environment. H...

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Published in:Scientific reports 2018-03, Vol.8 (1), p.4661
Main Authors: Park, Garam, Oh, In-Hwan, Park, J M Sungil, Jung, Jinyong, You, Chun-Yeol, Kim, June-Seo, Kim, Yonghwan, Jung, Jong Hoon, Hur, Namjung, Kim, Younghak, Kim, J-Y, Hong, Chang Seop, Kim, Ki-Yeon
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Language:eng
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Summary:Two dimensional layered organic-inorganic halide perovskites offer a wide variety of novel functionality such as solar cell and optoelectronics and magnetism. Self-assembly of these materials using solution process (ex. spin coating) makes crystalline thin films synthesized at ambient environment. However, flexibility of organic layer also poses a structure stability issue in perovskite thin films against environment factors (ex. moisture). In this study, we investigate the effect of solvents and moisture on structure and property in the (C H (CH ) NH ) (Cu, Mn)Cl (Cu-PEA, Mn-PEA) perovskite thin films spin-coated on Si wafer using three solvents (H O, MeOH, MeOH + H O). A combination of x-ray diffraction (XRD) and x-ray absorption spectroscopy (XAS) show that relative humidity (RH) has a profound effect on perovskite thin films during sample synthesis and storage, depending on the kind of solvent used. The ones prepared using water (Cu-PEA:H O, Mn-PEA:H O) show quite different behavior from the other cases. According to time-dependent XRD, reversible crystalline-amorphous transition takes place depending on RH in the former cases, whereas the latter cases relatively remain stable. It also turns out from XAS that Mn-PEA thin films prepared with solvents such as MeOH and MeOH + H O are disordered to the depth of about 4 nm from surface.
ISSN:2045-2322