Nanoscale depth-resolved cathodoluminescence spectroscopy of ZnO surfaces and metal interfaces

The electronic properties of ZnO surfaces and interfaces has until recently been relatively unexplored. We have used a complement of ultrahigh vacuum scanning electron microscope (SEM)-based, depth-resolved cathodoluminescence spectroscopy (DRCLS), temperature-dependent charge transport, trap spectr...

Full description

Saved in:
Bibliographic Details
Published in:Superlattices and microstructures 2009-04, Vol.45 (4), p.206-213
Main Authors: Brillson, L.J., Mosbacker, H.L., Doutt, D.L., Dong, Y., Fang, Z.-Q., Look, D.C., Cantwell, G., Zhang, J., Song, J.J.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Cathodoluminescence spectroscopy
Defects
Interface
Kelvin probe force microscopy
Scanning electron microscope
Surface
ZnO
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The electronic properties of ZnO surfaces and interfaces has until recently been relatively unexplored. We have used a complement of ultrahigh vacuum scanning electron microscope (SEM)-based, depth-resolved cathodoluminescence spectroscopy (DRCLS), temperature-dependent charge transport, trap spectroscopy, and surface science techniques to probe the electronic and chemical properties of clean surfaces and interfaces on a nanometer scale. DRCLS reveals remarkable nanoscale correlations of native point defect distributions with surface and sub-surface defects calibrated with capacitance trap spectroscopies, atomic force microscopy, and Kelvin probe force microscopy. The measurement of these near-surface states associated with native point defects in the ZnO bulk and those induced by interface chemical bonding is a powerful extension of cathodoluminescence spectroscopy that provides a guide to understanding and controlling ZnO electronic contacts.
ISSN:0749-6036
1096-3677
DOI:10.1016/j.spmi.2008.11.008