Loading…

High-Sensitivity Optically Modulated Scatterer for Electromagnetic-Field Measurement

The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2007-04, Vol.56 (2), p.486-490
Main Authors: Ray-Rong Lao, Wen-Lie Liang, Wen-Tron Shay, Thompson, R.P., Dudley, R.A., Merckel, O., Ribiere-Tharaud, N., Bolomey, J.-C., Jenn-Hwan Tarng
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2007.890627