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High-Sensitivity Optically Modulated Scatterer for Electromagnetic-Field Measurement
The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated...
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Published in: | IEEE transactions on instrumentation and measurement 2007-04, Vol.56 (2), p.486-490 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application |
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ISSN: | 0018-9456 1557-9662 |
DOI: | 10.1109/TIM.2007.890627 |