Self-referencing substrates for optical interferometric biosensors

Optical interference is a powerful technique for monitoring surface topography or refractive index changes in a thin film layer. Reflectance spectroscopy provides label-free biosensing capability by monitoring small variations in interference signature resulting from optical path length changes from...

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Bibliographic Details
Published in:Journal of modern optics 2010-09, Vol.57 (16), p.1564-1569
Main Authors: Vedula, R., Daaboul, G., Reddington, A., Özkumur, E., Bergstein, D.A., Ünlü, M.S.
Format: Article
Language:English
Subjects:
Biological and medical sciences
Biosensors
Biotechnology
DNA/protein microarray
Exact sciences and technology
Fluctuation
Fundamental and applied biological sciences. Psychology
General equipment and techniques
high-throughput
Illumination
Imaging
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Interferometers
interferometry
label-free biosensor
Methods. Procedures. Technologies
Monitoring
Optical instruments, equipment and techniques
Physics
Sensors (chemical, optical, electrical, movement, gas, etc.)
remote sensing
silicon fabrication
Spectroscopy
Spectrum analysis
Thin films
Topography
Various methods and equipments
Wavelengths
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Summary:Optical interference is a powerful technique for monitoring surface topography or refractive index changes in a thin film layer. Reflectance spectroscopy provides label-free biosensing capability by monitoring small variations in interference signature resulting from optical path length changes from surface-adsorbed biomolecules. Spectral reflectance data can be acquired either by broad wavelength illumination and spectroscopy at a single point, thus necessitating scanning, or by varying the wavelength of illumination and imaging the reflected intensity allowing for acquisition of a spectral image of a large field of view simultaneously. In imaging modalities, intensity fluctuations of the illuminating light source couple into the detected signal, increasing the noise in measured surface profiles. This article introduces a simple technique for eliminating the effects of illumination light power fluctuations by fabricating on-substrate self-reference regions to measure and normalize for the incident intensity, simplifying the overall platform for reflection or transmission-based imaging biosensors. Experimental results demonstrate that the sensitivity performance using self-referencing is equivalent or better than an optimized system with an external reference.
ISSN:0950-0340
1362-3044
DOI:10.1080/09500340.2010.507883