Estimation of thin-film platinum thermometer precision in the range 13.8–273.16 K and common mathematical description above 70 K

The temperature-resistance dependence of 10 thin-film platinum sensors was experimentally studied between 5 K and 300 K. A method was proposed for evaluating data errors in both coordinates. The orders of magnitude of the errors for the investigated thermometers were ± (5–8) mK for temperature and ±...

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Bibliographic Details
Published in:Cryogenics (Guildford) 1996, Vol.36 (8), p.599-603
Main Authors: Dimitrov, D.A., Georgiev, J.K., Zahariev, A.L., Bivas, I.
Format: Article
Language:English
Subjects:
Errors
Exact sciences and technology
Heat resistance
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Mathematical techniques
Physics
Platinum
resistance
Sensors
standard deviation
Statistical methods
Temperature
Thermal cycling
Thermal effects
Thermal instruments, apparatus and techniques
Thermometry
Thin films
thin-film platinum sensor
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Summary:The temperature-resistance dependence of 10 thin-film platinum sensors was experimentally studied between 5 K and 300 K. A method was proposed for evaluating data errors in both coordinates. The orders of magnitude of the errors for the investigated thermometers were ± (5–8) mK for temperature and ± (2–3) mΩ for resistance. Common mathematical descriptions of T(R) and R(T) functions above 70 K and a two-point method for individual calibration are proposed.
ISSN:0011-2275
1879-2235
DOI:10.1016/0011-2275(96)00028-8