SimulaTEM: Multislice simulations for general objects

In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, qua...

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Bibliographic Details
Published in:Ultramicroscopy 2010, Vol.110 (2), p.95-104
Main Authors: Gómez-Rodríguez, A., Beltrán-del-Río, L.M., Herrera-Becerra, R.
Format: Article
Language:English
Subjects:
Electron diffraction
High resolution electron microscopy
Image simulation
Multislice
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Summary:In this work we present the program SimulaTEM for the simulation of high resolution micrographs and diffraction patterns. This is a program based on the multislice approach that does not assume a periodic object. It can calculate images from finite objects, from amorphous samples, from crystals, quasicrystals, grain boundaries, nanoparticles or arbitrary objects provided the coordinates of all the atoms can be supplied.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2009.09.010