Linear stability of particle-laden thin films

Recent experiments [Zhou, Dupuy, Bertozzi, and Hosoi, Phys. Rev. Lett., 94 (2005)] of particle-laden film flow on an incline demonstrate new behavior distinct from the well-known clear fluid case, including the formation of a particle-rich ridge which can stabilize the advancing contact line with re...

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Bibliographic Details
Published in:The European physical journal. ST, Special topics Special topics, 2009, Vol.166 (1), p.77-81
Main Authors: Cook, B., Alexandrov, O., Bertozzi, A.
Format: Article
Language:English
Subjects:
Atomic
Classical and Continuum Physics
Condensed Matter Physics
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Materials Science
Measurement Science and Instrumentation
Molecular
Optical and Plasma Physics
Other nonelectronic properties
Physics
Physics and Astronomy
Regular Article
Solid-fluid interfaces
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:Recent experiments [Zhou, Dupuy, Bertozzi, and Hosoi, Phys. Rev. Lett., 94 (2005)] of particle-laden film flow on an incline demonstrate new behavior distinct from the well-known clear fluid case, including the formation of a particle-rich ridge which can stabilize the advancing contact line with respect to “fingering" perturbations. We consider a model similar to that of Zhou et al. with the additional regularizing effect of shear-induced diffusion. A linear stability analysis demonstrates that particle settling moderately reduces the growth rate of unstable modes, while increasing the most unstable wavelength.
ISSN:1951-6355
1951-6401
DOI:10.1140/epjst/e2009-00882-2