Non-destructive elemental depth-profiling with muonic X-rays

An elemental analysis method using muonic X-rays has been developed. Applying the unique features of the negative muon, this method enables elemental distribution in an object to be obtained three dimensionally and non-destructively. Especially, by choosing the incident muon beam energy, depth-profi...

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Bibliographic Details
Published in:Journal of radioanalytical and nuclear chemistry 2008-12, Vol.278 (3), p.777-781
Main Authors: Kubo, M. K., Moriyama, H., Tsuruoka, Y., Sakamoto, S., Koseto, E., Saito, T., Nishiyama, K.
Format: Article
Language:English
Subjects:
Chemistry
Chemistry and Materials Science
Diagnostic Radiology
Hadrons
Heavy Ions
Inorganic Chemistry
Instrumentation
Nuclear Chemistry
Nuclear Physics
Physical Chemistry
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Summary:An elemental analysis method using muonic X-rays has been developed. Applying the unique features of the negative muon, this method enables elemental distribution in an object to be obtained three dimensionally and non-destructively. Especially, by choosing the incident muon beam energy, depth-profiling as deep as several cm from the surface can be achieved by detecting the high energy muonic X-rays carrying the information of the atom which captured the muon. We obtained some preliminary results and showed the applicability of the technique in future analytical facilities.
ISSN:0236-5731
1588-2780
DOI:10.1007/s10967-008-1610-x