Origin of the anomalous X-ray diffraction in phthalocyanine films

The impact of the submolecular electron density on the X-ray diffraction profile of a layer-stacked thin film is studied experimentally and compared with numerical simulations based on the molecular structure and angular arrangement. Important structural information is contained in the X-ray diffrac...

Full description

Saved in:
Bibliographic Details
Published in:Europhysics letters 2008-09, Vol.83 (5), p.56001-56001(5)
Main Authors: Liu, Ge, Gredig, T, Schuller, I. K
Format: Article
Language:English
Subjects:
68.35.bm
68.37.-d
68.55.-a
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The impact of the submolecular electron density on the X-ray diffraction profile of a layer-stacked thin film is studied experimentally and compared with numerical simulations based on the molecular structure and angular arrangement. Important structural information is contained in the X-ray diffraction profile of highly anisotropic molecular thin films, such as phthalocyanines. The results show that the intensity distribution of the diffraction peaks belonging to the same series of lattice planes provides important structural information including the molecular tilt angle and the center electron density of the molecule.
ISSN:0295-5075
1286-4854
DOI:10.1209/0295-5075/83/56001