Imprint Lithography with 25-Nanometer Resolution

A high-throughput lithographic method with 25-nanometer resolution and smooth vertical sidewalls is proposed and demonstrated. The technique uses compression molding to create a thickness contrast pattern in a thin resist film carried on a substrate, followed by anisotropic etching to transfer the p...

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Bibliographic Details
Published in:Science (American Association for the Advancement of Science) 1996-04, Vol.272 (5258), p.85-87
Main Authors: Chou, Stephen Y., Krauss, Peter R., Renstrom, Preston J.
Format: Article
Language:eng
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Summary:A high-throughput lithographic method with 25-nanometer resolution and smooth vertical sidewalls is proposed and demonstrated. The technique uses compression molding to create a thickness contrast pattern in a thin resist film carried on a substrate, followed by anisotropic etching to transfer the pattern through the entire resist thickness. Metal patterns with a feature size of 25 nanometers and a period of 70 nanometers were fabricated with the use of resist templates created by imprint lithography in combination with a lift-off process. With further development, imprint lithography should allow fabrication of sub-10-nanometer structures and may become a commercially viable technique for manufacturing integrated circuits and other nanodevices.
ISSN:0036-8075
1095-9203