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Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness
This paper presents a two-degree-of-freedom (two-DOF) linear encoder which can measure the position along the moving axis ( X-axis) and the straightness along the axis vertical to the moving axis ( Z-axis) of a precision linear stage simultaneously. The two-DOF linear encoder is composed of a reflec...
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Published in: | Precision engineering 2010, Vol.34 (1), p.145-155 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | This paper presents a two-degree-of-freedom (two-DOF) linear encoder which can measure the position along the moving axis (
X-axis) and the straightness along the axis vertical to the moving axis (
Z-axis) of a precision linear stage simultaneously. The two-DOF linear encoder is composed of a reflective-type scale grating and an optical sensor head. A reference grating, which is identical to the scale grating except the scale length, is employed in the optical sensor head. Positive and negative first-order diffracted beams from the two gratings are superposed with each other in the optical sensor head to generate interference signals. The optical configuration is arranged in such a way that the direction of displacement in each axis can also be detected. A prototype two-DOF linear encoder is designed and constructed. The size of the optical sensor head is about 50
mm (
X)
×
50
mm (
Y)
×
30
mm (
Z) and the pitch of the grating is 1.6
μm. It has been confirmed that the prototype two-DOF linear encoder has sub-nanometer resolutions in both the
X- and
Z-axes. |
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ISSN: | 0141-6359 1873-2372 |
DOI: | 10.1016/j.precisioneng.2009.05.008 |