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Design and construction of a two-degree-of-freedom linear encoder for nanometric measurement of stage position and straightness

This paper presents a two-degree-of-freedom (two-DOF) linear encoder which can measure the position along the moving axis ( X-axis) and the straightness along the axis vertical to the moving axis ( Z-axis) of a precision linear stage simultaneously. The two-DOF linear encoder is composed of a reflec...

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Bibliographic Details
Published in:Precision engineering 2010, Vol.34 (1), p.145-155
Main Authors: Kimura, Akihide, Gao, Wei, Arai, Yoshikazu, Lijiang, Zeng
Format: Article
Language:English
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Summary:This paper presents a two-degree-of-freedom (two-DOF) linear encoder which can measure the position along the moving axis ( X-axis) and the straightness along the axis vertical to the moving axis ( Z-axis) of a precision linear stage simultaneously. The two-DOF linear encoder is composed of a reflective-type scale grating and an optical sensor head. A reference grating, which is identical to the scale grating except the scale length, is employed in the optical sensor head. Positive and negative first-order diffracted beams from the two gratings are superposed with each other in the optical sensor head to generate interference signals. The optical configuration is arranged in such a way that the direction of displacement in each axis can also be detected. A prototype two-DOF linear encoder is designed and constructed. The size of the optical sensor head is about 50 mm ( X) × 50 mm ( Y) × 30 mm ( Z) and the pitch of the grating is 1.6 μm. It has been confirmed that the prototype two-DOF linear encoder has sub-nanometer resolutions in both the X- and Z-axes.
ISSN:0141-6359
1873-2372
DOI:10.1016/j.precisioneng.2009.05.008