Grain boundary migration during abnormal grain growth in nanocrystalline Ni

The transformation mechanisms of abnormal grain growth in nanocrystalline Ni were studied extensively by transmission electron microscopy (TEM). A combination of in situ TEM annealing and ex situ annealing followed by TEM characterization was used. It was observed that grain boundary migration is bo...

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Bibliographic Details
Published in:Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2008-10, Vol.494 (1-2), p.232-238
Main Authors: Hibbard, G.D., Radmilovic, V., Aust, K.T., Erb, U.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Grain and twin boundaries
Grain growth
In situ electron microscopy
Nanostructured materials
Nickel
Physics
Structure of solids and liquids
crystallography
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Summary:The transformation mechanisms of abnormal grain growth in nanocrystalline Ni were studied extensively by transmission electron microscopy (TEM). A combination of in situ TEM annealing and ex situ annealing followed by TEM characterization was used. It was observed that grain boundary migration is both spatially and temporally non-uniform; migration occurs in a series of discrete steps, which are followed by periods of stagnation.
ISSN:0921-5093
1873-4936
DOI:10.1016/j.msea.2008.04.054