Crystal structures, site occupations and phase equilibria in the system V–Zr–Ge

The V–Zr–Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe ( tI12, I4/ mmm, CeScSi-type), V x Zr 5− x Ge 4 ( oP36, Pnma, Sm 5Ge 4-type) and V 4+ x Zr 2− x Ge 5 ( oI44, Ibam, Si 5V 6-type) were structurally characterized. Optical microscopy and powder...

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Bibliographic Details
Published in:Solid state sciences 2009-08, Vol.11 (8), p.1475-1483
Main Authors: Marker, Martin C.J., Effenberger, Herta S., Richter, Klaus W.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Crystal structure
Equations of state, phase equilibria, and phase transitions
Exact sciences and technology
General studies of phase transitions
Growth from solutions
Materials science
Methods of crystal growth
physics of crystal growth
Order-disorder and statistical mechanics of model systems
Partial ordering
Phase diagram
Phase diagrams and microstructures developed by solidification and solid-solid phase transformations
Phase diagrams of metals and alloys
Physics
Structure of solids and liquids
crystallography
Structure of specific crystalline solids
Transition metal germanides
V–Zr–Ge system
X-ray diffraction
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Summary:The V–Zr–Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe ( tI12, I4/ mmm, CeScSi-type), V x Zr 5− x Ge 4 ( oP36, Pnma, Sm 5Ge 4-type) and V 4+ x Zr 2− x Ge 5 ( oI44, Ibam, Si 5V 6-type) were structurally characterized. Optical microscopy and powder X-ray diffraction (XRD) were used for initial sample characterization and electron probe microanalysis (EPMA) of the annealed samples was used to determine the exact phase compositions. The variation of the cell parameters of the various ternary solid solutions with the composition was determined. The three ternary phases were structurally characterized by means of single crystal and powder XRD. While VZrGe is almost a line compound, V x Zr 5− x Ge 4 (0.2 ≤ x ≤ 3.0) and V 4+ x Zr 2− x Ge 5 (0.06 ≤ x ≤ 1.2) are forming extended solid solution ranges stabilized by differential fractional site occupancy of V and Zr on the metal sites. [Display omitted]
ISSN:1293-2558
1873-3085
DOI:10.1016/j.solidstatesciences.2009.05.005