Fabrication, Structural Characterization and Testing of a Nanostructured Tin Oxide Gas Sensor

A nanostructured SnO 2 conductometric gas sensor was produced from thermally evaporated Sn clusters using a thermal oxidation process. SnO 2 clusters were simultaneously formed in an identical process on a Si 3 N 4 membrane featuring an aperture created by a focused ion beam (FIB). Clusters attached...

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Bibliographic Details
Published in:IEEE sensors journal 2009-05, Vol.9 (5), p.563-568
Main Authors: Partridge, J.G., Field, M.R., Sadek, A.Z., Kalantar-zadeh, K., Du Plessis, J., Taylor, M.B., Atanacio, A., Prince, K.E., McCulloch, D.G.
Format: Article
Language:English
Subjects:
Apertures
Biomembranes
Clusters
Fabrication
Gas detectors
Gas sensors
Ion beams
Mass spectrometry
Mass spectroscopy
microscopy
Nanostructure
nanotechnology
Nitrogen dioxide
Operating temperature
Oxidation
Sensors
Temperature sensors
Testing
Thermal conductivity
thin-film devices
Tin
Tin dioxide
Tin oxides
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Summary:A nanostructured SnO 2 conductometric gas sensor was produced from thermally evaporated Sn clusters using a thermal oxidation process. SnO 2 clusters were simultaneously formed in an identical process on a Si 3 N 4 membrane featuring an aperture created by a focused ion beam (FIB). Clusters attached to the vertical edges of the aperture were imaged using a transmission electron microscope. The original morphology of the Sn cluster film was largely preserved after the thermal oxidation process and the thermally oxidized clusters were found to be polycrystalline and rutile in structure. NO 2 gas sensing measurements were performed with the sensor operating at various temperatures between 25degC and 290degC. At an operating temperature of 210degC, the sensor demonstrated a normalized change in resistance of 3.1 upon exposure to 510 ppb of NO 2 gas. The minimum response and recovery times for this exposure were 45 s and 30 s at an operating temperature of 265degC. The performance of the SnO 2 sensor compared favorably with previously published results. Finally, secondary ion mass spectrometry and X-ray photoelectron spectroscopy were used to establish the levels of nitrogen present in the films following exposure to NO 2 gas.
ISSN:1530-437X
1558-1748
DOI:10.1109/JSEN.2009.2016613