Probing the Operation of Quantum-Dot Light-Emitting Diodes Using Electrically Pumped Transient Absorption Spectroscopy

The quantum-dot light-emitting diode (QLED) is a new generation light emission source that holds great promise for display and lighting applications. Understanding the dynamics of electrons and holes in QLEDs during their operation is crucial for future QLED optimization, but a time-resolved technol...

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Bibliographic Details
Published in:The journal of physical chemistry letters 2024-08, Vol.15 (33), p.8593-8599
Main Authors: Yan, Xianchang, Chen, Cuili, Wu, Boning, Sun, Fengke, Bao, Hui, Tian, Wenming, Chang, Shuai, Zhong, Haizheng, Jin, Shengye
Format: Article
Language:English
Subjects:
Physical Insights into Light Interacting with Matter
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Summary:The quantum-dot light-emitting diode (QLED) is a new generation light emission source that holds great promise for display and lighting applications. Understanding the dynamics of electrons and holes in QLEDs during their operation is crucial for future QLED optimization, but a time-resolved technology capable of characterizing electrons is still lacking. To tackle this challenge, we develop a unique electrically pumped transient absorption (E-TA) spectroscopy to probe the density of electrons in the QD layer with a nanosecond time resolution. The E-TA result provides a comprehensive understanding of the electron dynamics in QLEDs by quantifying the electron injection time after external voltage on, electron release time after external voltage off, and equilibrated electron density (N e) in the QD layer during device operation. By combining E-TA technology with time-resolved electroluminescence and transient current measurements, we present a comprehensive overview of the dynamics of both electrons and holes in a QLED during operation.
ISSN:1948-7185
1948-7185
DOI:10.1021/acs.jpclett.4c02127