Atomic Force Microscopy-Based Nanoscale Infrared Techniques for Catalysis

Atomic force microscopy (AFM)-based nanoscale infrared (nano-IR) techniques have found extensive application in the fields of chemistry, physics, and materials science, enabling the visualization of nanoscale features that surpass the optical diffraction limit. More recently, tentative investigation...

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Bibliographic Details
Published in:The journal of physical chemistry letters 2023-12, Vol.14 (50), p.11318-11323
Main Authors: Li, Jian, Liang, Jing, Lan, Mu-Hao, Xia, Xing-Hua
Format: Article
Language:English
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Summary:Atomic force microscopy (AFM)-based nanoscale infrared (nano-IR) techniques have found extensive application in the fields of chemistry, physics, and materials science, enabling the visualization of nanoscale features that surpass the optical diffraction limit. More recently, tentative investigations have been conducted into the use of these techniques in the field of catalysis, particularly in studying interfacial processes involving molecular monolayer samples. IR nanoimaging and nanospectroscopy offer unique perspectives on catalytic processes. Considering the specific characteristics of catalytic processes, this Perspective highlights the need for and reviews the current status of AFM-based nano-IR techniques for catalysis investigations, which aims to contribute to a deeper understanding of the nanoscale mechanisms underlying the catalytic processes.
ISSN:1948-7185
1948-7185
DOI:10.1021/acs.jpclett.3c02937