Trends and challenges in VLSI circuit reliability

Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.

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Bibliographic Details
Published in:IEEE MICRO 2003-07, Vol.23 (4), p.14-19
Main Author: Constantinescu, C.
Format: Article
Language:English
Subjects:
Circuit faults
Circuit reliability
Circuits
Copper
Dealing
Electromigration
Faults
Frequency
Integrated circuit interconnections
Integrated circuits
Microprocessors
Random access memory
Semiconductor device manufacture
Technology
Trends
Very large scale integration
Voltage
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Description
Summary:Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.
ISSN:0272-1732
1937-4143
DOI:10.1109/MM.2003.1225959