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Temperature dependence of DC and RF characteristics of AlInAs/GaInAs HBT's

Device characteristics of compositionally graded AlInAs/GaInAs heterojunction bipolar transistors (HBTs) measured and analyzed from cryogenic temperatures up to 250 degrees C are discussed. Excellent stability in DC and RF performance is observed at elevated temperatures, which is desirable for high...

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Bibliographic Details
Published in:IEEE transactions on electron devices 1993-09, Vol.40 (9), p.1583-1588
Main Authors: Hafizi, M., Stanchina, W.E., Metzger, R.A., Macdonald, P.A., Williams, F.
Format: Article
Language:English
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Summary:Device characteristics of compositionally graded AlInAs/GaInAs heterojunction bipolar transistors (HBTs) measured and analyzed from cryogenic temperatures up to 250 degrees C are discussed. Excellent stability in DC and RF performance is observed at elevated temperatures, which is desirable for high-speed and high-density integrated circuit applications. DC current gain exhibits about 10% variation over the entire measured temperature range. F/sub T/ and f/sub max/ at 125 degrees C decreased by approximately 10% from their room-temperature values while improving steadily when the device was cooled down to near-liquid-helium temperature, the common-emitter breakdown voltage is 8.0 V at room temperature and reduces to 7.5 V at 125 degrees C. Likewise, the collector-base breakdown voltage and the base-emitter breakdown voltage reduce by about 0.5 V over the same temperature range. The breakdown voltages increase significantly at cryogenic temperatures. The low turn-on voltage and excellent low-temperature characteristics make the AlInAs/GaInAs HBT attractive for cryogenic applications.< >
ISSN:0018-9383
1557-9646
DOI:10.1109/16.231562