A novel probe of intrinsic electronic structure: hard X-ray photoemission spectroscopy

We have realized hard X-ray (HX) photoemission spectroscopy (PES) with high throughput and high-energy resolution for core level and valence band studies using high-energy and high-brilliance synchrotron radiation at SPring-8. This is a brand new method because large escape depth of high-energy phot...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena 2005-06, Vol.144 (Complete), p.1063-1065
Main Authors: Takata, Y., Tamasaku, K., Nishino, Y., Miwa, D., Yabashi, M., Ikenaga, E., Horiba, K., Arita, M., Shimada, K., Namatame, H., Nohira, H., Hattori, T., Södergren, S., Wannberg, B., Taniguchi, M., Shin, S., Ishikawa, T., Kobayashi, K.
Format: Article
Language:English
Subjects:
Bulk probe
Electronic structure
Photoemission spectroscopy
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Summary:We have realized hard X-ray (HX) photoemission spectroscopy (PES) with high throughput and high-energy resolution for core level and valence band studies using high-energy and high-brilliance synchrotron radiation at SPring-8. This is a brand new method because large escape depth of high-energy photoelectrons enables us to probe intrinsic bulk states free from surface condition. By use of a newly developed electron energy analyzer and well-focused X-rays, high-energy resolution of 75 meV ( E/Δ E = 79,000) was realized for 5.95 keV photoelectrons.
ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2005.01.044