Charge yield for cobalt-60 and 10-keV X-ray irradiations of MOS devices

The radiation response of MOS devices exposed to /sup 60/Co and low-energy ( approximately 10 keV) X-ray irradiation is evaluated as a function of electric field during exposure. Improved charge yield estimates are obtained for /sup 60/Co irradiations at fields below 1 MV/cm by matching voltage shif...

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Bibliographic Details

Published in:	IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1991-12, Vol.38 (6), p.1187-1194
Main Authors:	Shaneyfelt, M.R., Fleetwood, D.M., Schwank, J.R., Hughes, K.L.
Format:	Article
Language:	eng
Subjects:	426000 - Engineering- Components, Electron Devices & Circuits- (1990-) 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems Annealing Applied sciences BETA DECAY RADIOISOTOPES BETA-MINUS DECAY RADIOISOTOPES CHARGE COLLECTION COBALT 60 COBALT ISOTOPES Compound structure devices Costs DOSE RATES ELECTROMAGNETIC RADIATION Electronics ENERGY RANGE ENGINEERING Exact sciences and technology HARDENING INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY INTERFACES INTERMEDIATE MASS NUCLEI INTERNAL CONVERSION RADIOISOTOPES Ionizing radiation IONIZING RADIATIONS Isolation technology ISOMERIC TRANSITION ISOTOPES ISOTOPES KEV RANGE KEV RANGE 01-10 Laboratories MINUTES LIVING RADIOISOTOPES MOS devices MOS TRANSISTORS NUCLEI ODD-ODD NUCLEI PHYSICAL RADIATION EFFECTS RADIATION EFFECTS RADIATION HARDENING RADIATIONS RADIOISOTOPES SEMICONDUCTOR DEVICES Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Spontaneous emission Testing TRANSISTORS Voltage X RADIATION YEARS LIVING RADIOISOT Yield estimation
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