Structural, magnetic and magnetoelectrical properties of La1−xSrxMnO3 thin films prepared by metal-organic decomposition

La1-xSrxMnO3 thin films with x = 0.1, 0.33 and 0.6 were prepared on amorphous quartz substrate by metal-organic decomposition. X-ray diffraction spectra showed that the films were polycrystalline oriented mainly to the (101) direction. Atomic force microscope measurement indicated that the average g...

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Bibliographic Details
Published in:Surface & coatings technology 2003-06, Vol.169-170, p.536-539
Main Authors: Shen, Honglie, Zhu, Xiangrong, Sakamoto, Isao, Okutomi, Mamoru, Yanagisawa, Takeshi, Tsukamato, Koichi, Higuchi, Noboru
Format: Article
Language:English
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Summary:La1-xSrxMnO3 thin films with x = 0.1, 0.33 and 0.6 were prepared on amorphous quartz substrate by metal-organic decomposition. X-ray diffraction spectra showed that the films were polycrystalline oriented mainly to the (101) direction. Atomic force microscope measurement indicated that the average grain size of the films were 200 nm with a root-mean-square roughness approximately 8.2 nm. SQUID measurement from 5 to 360 K revealed that the magnetization in La1-xSrxMnO3 thin films decreased with increasing temperature for x equal to or less than 0.33. For La0.67Sr0.33MnO3 samples, a good field linearity and reversibility of magnetoresistance (MR) were observed at 300 K and a low magnetic field MR was found at 77 K.
ISSN:0257-8972
DOI:10.1016/S0257-8972(03)00195-6