Dynamic ESPI with subtraction–addition method for obtaining the phase

Dynamic electronic speckle pattern interferometry (DESPI) was developed for in situ observations. The quantitative evaluation of the deformation field was performed through 2-D subtraction–addition method (SAM) for phase analysis. This method does not require additional phase modulation, which makes...

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Bibliographic Details
Published in:Optics communications 2002-10, Vol.212 (1), p.35-43
Main Authors: Madjarova, Violeta, Toyooka, Satoru, Widiastuti, Rini, Kadono, Hirofumi
Format: Article
Language:English
Subjects:
Dynamic ESPI
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Gaussian filter
Imaging and optical processing
In situ observations
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Interferometers
Optical instruments, equipment and techniques
Optics
Phase analysis
Phase retrieval
Physics
Plastic deformation
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Summary:Dynamic electronic speckle pattern interferometry (DESPI) was developed for in situ observations. The quantitative evaluation of the deformation field was performed through 2-D subtraction–addition method (SAM) for phase analysis. This method does not require additional phase modulation, which makes it applicable to studying dynamic events. The method utilizes the ratio of the subtraction and addition correlation fringe patterns. The bias intensity that has to be removed from the addition images was determined by temporal averaging of a sequence of speckle patterns. To reduce the error, Gaussian filter was applied to the correlation fringe patterns. The deformation field was evaluated with accuracy of λ/10.
ISSN:0030-4018
1873-0310
DOI:10.1016/S0030-4018(02)01909-0