Experimental observation of Berreman modes in an uniaxial anisotropic nanoporous alumina film on aluminum substrate

In this Letter, we demonstrate experimentally and verify numerically the excitation of Berreman modes that propagate in a dielectric film of uniaxial anisotropic nanoporous alumina grown on an aluminum substrate. It is an air-dielectric-metal asymmetric polaritonic system with a real part of the eff...

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Bibliographic Details
Published in:Optics letters 2022-05, Vol.47 (10), p.2554-2557
Main Authors: Pratap, Dheeraj, Kumar Pradhan, Jitendra, Anantha Ramakrishna, S
Format: Article
Language:English
Subjects:
Aluminum oxide
Dielectrics
Excitation
Light reflection
Management systems
Polarized light
Substrates
Terahertz frequencies
Thermal management
Wave reflection
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Summary:In this Letter, we demonstrate experimentally and verify numerically the excitation of Berreman modes that propagate in a dielectric film of uniaxial anisotropic nanoporous alumina grown on an aluminum substrate. It is an air-dielectric-metal asymmetric polaritonic system with a real part of the effective permittivity having a value near zero. The modes are excited at a wavelength lower than the epsilon-near-zero wavelength region. Minimum reflection is observed for the mid-infrared p-polarized light, while maximum reflection is observed for the s-polarized light. The experimental results are numerically reproduced for both p- and s-polarized light and confirm the excitation of Berreman modes in the system. At the exciting wavelength, the field is confined in the dielectric region near the air-dielectric interface. The reported system is straightforward and can be easily fabricated over a large scale and is helpful in a variety of mid-infrared applications such as thermal management systems, sensors, passive radiative cooling devices, nonlinear applications, and terahertz frequency generation.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.456109