fcc titanium in Ti-Al multilayers

Thin titanium films deposited on aluminum, in a multilayered form, were found to transform from a hexagonal close-packed (hcp, P63/MMC) structure to the face-centered cubic structure (fcc, FM3M) upon thinning of cross sections for TEM study. The transformation results in twinned Al and Ti layers wit...

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Bibliographic Details
Published in:Materials letters 1994-08, Vol.20 (5), p.329-334
Main Authors: Shechtman, D., van Heerden, D., Josell, D.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Metals. Metallurgy
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Summary:Thin titanium films deposited on aluminum, in a multilayered form, were found to transform from a hexagonal close-packed (hcp, P63/MMC) structure to the face-centered cubic structure (fcc, FM3M) upon thinning of cross sections for TEM study. The transformation results in twinned Al and Ti layers with noncoherent Σ = 3 boundaries separating the twin related crystals in each layer. The as-deposited Ti is hcp and the Al fcc. The Ti layers studied varied in thickness between 30 and 500 nm. They were deposited by electron beam evaporation in vacuum, using 30 nm thick layers of Al to form multilayered films which contained between 10 and 100 bilayers. The study was conducted by TEM and X-ray diffraction and the hcp to fcc transformation of the Ti layers was observed in all the multilayers.
ISSN:0167-577X
1873-4979
DOI:10.1016/0167-577X(94)90039-6