Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector

Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector positioning and uniformity, and scan-distortion. By comparing...

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Bibliographic Details
Published in:Ultramicroscopy 2022-03, Vol.233, p.113457-113457, Article 113457
Main Authors: Mawson, T., Taplin, D.J., Brown, H.G., Clark, L., Ishikawa, R., Seki, T., Ikuhara, Y., Shibata, N., Paganin, D.M., Morgan, M.J., Weyland, M., Petersen, T.C., Findlay, S.D.
Format: Article
Language:English
Subjects:
Differential phase contrast
Graphene
Image simulation
Quantitative scanning transmission electron microscopy
Segmented detectors
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Summary:Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector positioning and uniformity, and scan-distortion. By comparing experimental case studies of monolayer and few-layer graphene with image simulations, we explore which parameters require the most precise characterisation for reliable and quantitative interpretation of the reconstructed phases. Coherent and incoherent lens aberrations are found to have the most significant impact. For images over a large field of view, the impact of noise and non-periodic boundary conditions are appreciable, but in this case study have less of an impact than artefacts introduced by beam deflections coupling to beam scanning (imperfect tilt-shift purity). •Many factors affect the accuracy of quantitative DPC STEM with segmented detectors.•We show absolute-scale experiment/theory comparisons for a graphene case study.•Uncertainty in the coherent and incoherent lens aberrations most limit accuracy.•Scan artefacts and shot noise limit accuracy for larger fields of view.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2021.113457