Altitude and latitude variations in avionics SEU and atmospheric neutron flux

The direct cause of single event upsets (SEUs) in static random-access memories (SRAMs) at aircraft altitudes by atmospheric neutrons has been documented previously. The variation of the in-flight SEU rate with latitude is demonstrated by new data over a wide range of geographical locations. Measure...

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Bibliographic Details

Published in:	IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1993-12, Vol.40 (6), p.1484-1490
Main Authors:	Normand, E., Baker, T.J.
Format:	Article
Language:	eng
Subjects:	Aerospace electronics Aircraft ALTITUDE Astronomy Atmosphere Atmospheric measurements Atmospheric modeling COSMIC RADIATION Cosmic rays EARTH ATMOSPHERE Earth, ocean, space Exact sciences and technology Extensive air showers GEOGRAPHICAL VARIATIONS INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY IONIZING RADIATIONS LATITUDE EFFECT MEMORY DEVICES NEUTRON FLUX Neutrons PHYSICAL RADIATION EFFECTS Protons RADIATION EFFECTS RADIATION FLUX RADIATIONS Random access memory SECONDARY COSMIC RADIATION Shape measurement Single event upset Solar system VARIATIONS 440200 > Radiation Effects on Instrument Components, Instruments, or Electronic Systems
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