Improved calibration and measurement of the scattering parameters of microwave integrated circuits

A novel procedure for the calibration of microwave integrated circuit test fixtures, based on a generalization of the through-reflect-line (TRL) algorithm, is presented. Its advantages compared with previous methods, namely bandwidth of validity and standards availability, are discussed. The approac...

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Bibliographic Details

Published in:	IEEE transactions on microwave theory and techniques 1989-11, Vol.37 (11), p.1675-1680
Main Authors:	Pantoja, R.R., Howes, M.J., Richardson, J.R., Pollard, R.D.
Format:	Article
Language:	eng
Subjects:	Applied sciences Bandwidth Calibration Circuit testing Electronics Exact sciences and technology Integrated circuit measurements Integrated circuit modeling Microwave and submillimeter wave devices, electron transfer devices Microwave integrated circuits Microwave measurements Scattering parameters Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transmission line matrix methods Transmission line measurements
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