The Yb/Al(110) interface studied by electron spectroscopy

Thin films of Yb overlayers on an Al(110) surface have been studied with different methods of electron spectroscopy. The applicability of using Auger electron spectroscopy (AES), reflection electron energy-loss spectroscopy (ELS) and X-ray photoelectron spectroscopy (XPS) for recognizing mixed-valen...

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Bibliographic Details
Published in:Surface science 1984-03, Vol.138 (1), p.148-158
Main Authors: Onsgaard, J., Chorkendorff, I., Ellegaard, O., Sørensen, O.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Metals, semimetals and alloys
Metals. Metallurgy
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Other interactions of matter with particles and radiation
Physics
Specific materials
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Summary:Thin films of Yb overlayers on an Al(110) surface have been studied with different methods of electron spectroscopy. The applicability of using Auger electron spectroscopy (AES), reflection electron energy-loss spectroscopy (ELS) and X-ray photoelectron spectroscopy (XPS) for recognizing mixed-valent Yb in the Yb/Al interface is discussed. Comparison between Yb + O 2 and Yb/Al shows that core hole interactions play a strong role in the ionization process which involves an ionization of the 4d shell in Yb. Diffusion of Yb into Al(110) can be described as a two step process.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(84)90501-6