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Inorganic Polymer Micropillar‐Based Solution Shearing of Large‐Area Organic Semiconductor Thin Films with Pillar‐Size‐Dependent Crystal Size

It is demonstrated that the crystal size of small‐molecule organic semiconductors can be controlled during solution shearing by tuning the shape and dimensions of the micropillars on the blade. Increasing the size and spacing of the rectangular pillars increases the crystal size, resulting in higher...

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Bibliographic Details
Published in:Advanced materials (Weinheim) 2018-07, Vol.30 (29), p.e1800647-n/a
Main Authors: Kim, Jin‐Oh, Lee, Jeong‐Chan, Kim, Min‐Ji, Noh, Hyunwoo, Yeom, Hye‐In, Ko, Jong Beom, Lee, Tae Hoon, Ko Park, Sang‐Hee, Kim, Dong‐Pyo, Park, Steve
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Language:English
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Summary:It is demonstrated that the crystal size of small‐molecule organic semiconductors can be controlled during solution shearing by tuning the shape and dimensions of the micropillars on the blade. Increasing the size and spacing of the rectangular pillars increases the crystal size, resulting in higher thin‐film mobility. This phenomenon is attributed as the microstructure changing the degree and density of the meniscus line curvature, thereby controlling the nucleation process. The use of allylhybridpolycarbosilane (AHPCS), an inorganic polymer, is also demonstrated as the microstructured blade for solution shearing, which has high resistance to organic solvents, can easily be microstructured via molding, and is flexible and durable. Finally, it is shown that solution shearing can be performed on a curved surface using a curved blade. These demonstrations bring solution shearing closer to industrial applications and expand its applicability to various printed flexible electronics. A flexible, durable, and solvent‐resistant inorganic polymer that can easily be microstructured via molding is utilized as a solution‐shearing blade for the generation of high‐quality large‐area organic semiconductor thin films. By manipulating the shape and size of the blade's microstructure, crystal size is controlled, through which the mobility of the thin film is enhanced.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201800647