Invasive device-associated infections caused by Pseudomonas aeruginosa in critically ill patients: evolution over 10 years

Invasive device-associated infections caused by Pseudomonas aeruginosa over 10 years (2007–2016) were assessed based on data from the ENVIN-HELICS registry (200 Spanish intensive care units). P. aeruginosa was the leading pathogen except in the last two years in which there was a slight decrease, wi...

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Bibliographic Details
Published in:The Journal of hospital infection 2018-11, Vol.100 (3), p.e204-e208
Main Authors: Álvarez-Lerma, F., Olaechea-Astigarraga, P., Palomar-Martínez, M., Catalan, M., Nuvials, X., Gimeno, R., Gracia-Arnillas, M.P., Seijas-Betolaza, I.
Format: Article
Language:English
Subjects:
Anti-pseudomonal drugs
Antimicrobial resistance
Catheter-Related Infections - epidemiology
Catheter-Related Infections - microbiology
Critical Illness
Critically ill
Cross Infection - epidemiology
Cross Infection - microbiology
Escherichia coli - isolation & purification
Escherichia coli Infections - epidemiology
Humans
Intensive care unit
Intensive Care Units
Invasive device-associated infection
Prevalence
Prospective Studies
Pseudomonas aeruginosa
Pseudomonas aeruginosa - isolation & purification
Pseudomonas Infections - epidemiology
Spain - epidemiology
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Summary:Invasive device-associated infections caused by Pseudomonas aeruginosa over 10 years (2007–2016) were assessed based on data from the ENVIN-HELICS registry (200 Spanish intensive care units). P. aeruginosa was the leading pathogen except in the last two years in which there was a slight decrease, with Escherichia coli as the leading aetiology. The rate of infections caused by P. aeruginosa remained between 12.0% and 14.6% throughout the study period. There was a significant increase of isolates resistant to imipenem, meropenem, ceftazidime, cefepime, and piperacillin–tazobactam. Multidrug-resistant and the sum of extensively drug- and pandrug-resistant strains also increased. Resistance to anti-pseudomonal antimicrobials remains a matter of concern.
ISSN:0195-6701
1532-2939
DOI:10.1016/j.jhin.2018.04.027