A direct electron detector for time-resolved MeV electron microscopy

The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter...

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Bibliographic Details
Published in:Review of scientific instruments 2017-03, Vol.88 (3), p.033702-033702
Main Authors: Vecchione, T., Denes, P., Jobe, R. K., Johnson, I. J., Joseph, J. M., Li, R. K., Perazzo, A., Shen, X., Wang, X. J., Weathersby, S. P., Yang, J., Zhang, D.
Format: Article
Language:English
Subjects:
ACCPHY, INST
Analog to digital conversion
Analog to digital converters
Data analysis
Detectors
Electron microscopy
Microscopy
OTHER INSTRUMENTATION
Recording
Scientific apparatus & instruments
Sensors
Spatial resolution
Vibration
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Summary:The introduction of direct electron detectors enabled the structural biology revolution of cryogenic electron microscopy. Direct electron detectors are now expected to have a similarly dramatic impact on time-resolved MeV electron microscopy, particularly by enabling both spatial and temporal jitter correction. Here we report on the commissioning of a direct electron detector for time-resolved MeV electron microscopy. The direct electron detector demonstrated MeV single electron sensitivity and is capable of recording megapixel images at 180 Hz. The detector has a 15-bit dynamic range, better than 30- μ m spatial resolution and less than 20 analogue-to-digital converter count RMS pixel noise. The unique capabilities of the direct electron detector and the data analysis required to take advantage of these capabilities are presented. The technical challenges associated with generating and processing large amounts of data are also discussed.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4977923