Nanoimaging of Open-Circuit Voltage in Photovoltaic Devices

A novel imaging platform to determine the open‐circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be...

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Bibliographic Details
Published in:Advanced energy materials 2015-12, Vol.5 (23), p.np-n/a
Main Authors: Tennyson, Elizabeth M., Garrett, Joseph L., Frantz, Jesse A., Myers, Jason D., Bekele, Robel Y., Sanghera, Jasbinder S., Munday, Jeremy N., Leite, Marina S.
Format: Article
Language:English
Subjects:
Electric potential
Kelvin probe force microscopy
Metrology
Microscopy
nanoimaging
Nanostructure
open-circuit voltage
Optoelectronic devices
Photovoltaic cells
photovoltaics
Solar cells
Voltage
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Summary:A novel imaging platform to determine the open‐circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments.
ISSN:1614-6832
1614-6840
DOI:10.1002/aenm.201501142