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Magnetic and structural changes in the near-surface epitaxial Y sub(2.95) La sub(0.05) Fe sub(5) O sub(12) films after high-dose ion implantation

The method of magnetic force microscopy was used to study the domain structure of various-thickness epitaxial Y sub(2.95) La sub(0.05) Fe sub(5) O sub(12) iron-yttrium garnet films modified by high-dose implantation of N+ nitrogen ions. The results of multi-crystal x-ray diffractometry were analyzed...

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Bibliographic Details
Published in:Applied optics (2004) 2016-04, Vol.55 (12), p.B144-B149
Main Authors: Fodchuk, I M, Gutsuliak, I I, Dovganiuk, V V, Kotsyubynskiy, A O, Pietsch, U, Pashniak, N V, Bonchyk, O Yu, Syvorotka, I M, Lytvyn, P M
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Language:English
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Summary:The method of magnetic force microscopy was used to study the domain structure of various-thickness epitaxial Y sub(2.95) La sub(0.05) Fe sub(5) O sub(12) iron-yttrium garnet films modified by high-dose implantation of N+ nitrogen ions. The results of multi-crystal x-ray diffractometry were analyzed, and a possible defect structure of garnets prior to and after implantation was identified. It was established that the reduction of magnetic losses observed after high-dose ion implantation is accompanied by the essential ordering of magnetic domains on the surface of implanted films. There is a direct dependence of electromagnetic properties on the dose of implanted atoms followed by a considerable sputtering and amorphization of the near-surface film layer and formation of a well-defined electromagnetic structure.
ISSN:1559-128X
2155-3165
DOI:10.1364/AO.55.00B144