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Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities
This review examines characterization challenges inherently associated with understanding nanomaterials and the roles surface and interface characterization methods can play in meeting some of the challenges. In parts of the research community, there is growing recognition that studies and published...
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| Published in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2013-09, Vol.31 (5), p.50820-50820 |
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| Main Authors: | , , , , , , , , , , , , , , |
| Format: | Article |
| Language: | English |
| Subjects: | |
| Citations: | Items that this one cites Items that cite this one |
| Online Access: | Get full text |
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| Summary: | This review examines characterization challenges inherently associated with understanding
nanomaterials and the roles
surface and interface characterization methods can play in meeting some of the challenges. In parts
of the research community, there is growing recognition that studies and published reports on the
properties and behaviors of
nanomaterials often have
reported inadequate or incomplete characterization. As a consequence, the true value of the data in
these reports is, at best, uncertain. With the increasing importance of nanomaterials in fundamental research and
technological applications,
it is desirable that researchers from the wide variety of disciplines involved recognize the nature
of these often unexpected challenges associated with reproducible synthesis and characterization of
nanomaterials, including the
difficulties of maintaining desired materials properties during handling and processing due to their dynamic nature. It is equally valuable for
researchers to understand how characterization approaches (surface and otherwise) can help to
minimize synthesis surprises and to determine how (and how quickly) materials and properties change in different
environments. Appropriate application of traditional surface sensitive analysis methods (including x-ray photoelectron and Auger electron
spectroscopies, scanning probe microscopy, and secondary ion mass spectroscopy) can provide
information that helps address several of the analysis needs. In many circumstances, extensions of traditional data
analysis can provide
considerably more information than normally obtained from the data collected. Less common or
evolving methods with surface selectivity (e.g., some variations of nuclear magnetic resonance, sum
frequency generation, and low and medium energy ion scattering) can provide information about
surfaces or interfaces in working environments (operando or in
situ) or information not provided by more traditional methods. Although these methods may
require instrumentation or expertise not generally available, they can be particularly useful in
addressing specific questions, and examples of their use in nanomaterial research are presented. |
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| ISSN: | 0734-2101 1520-8559 0734-2101 |
| DOI: | 10.1116/1.4818423 |