Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors

A method based on scanning Kelvin probe microscopy is developed to probe the effects of minority carriers on the switching characteristics of organic field‐effect transistors. The mobility of the minority carriers is extracted and the role they play in screening of the gate potential in the OFF stat...

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Bibliographic Details
Published in:Advanced materials (Weinheim) 2016-06, Vol.28 (23), p.4713-4719
Main Authors: Hu, Yuanyuan, Pecunia, Vincenzo, Jiang, Lang, Di, Chong-An, Gao, Xike, Sirringhaus, Henning
Format: Article
Language:English
Subjects:
Field effect transistors
Majority carriers
Microscopy
Minority carriers
organic transistors
Scanning
scanning Kelvin probe microscopy
Screening
Semiconductor devices
Switching
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Summary:A method based on scanning Kelvin probe microscopy is developed to probe the effects of minority carriers on the switching characteristics of organic field‐effect transistors. The mobility of the minority carriers is extracted and the role they play in screening of the gate potential in the OFF state and in recombination of trapped majority carriers trapped after an ON state is understood.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201503812