Express Methods for Measurement of Electroconductivity of Semiconductor Layered Crystal

We describe theoretically the grounded method of measuring the conductivity of anisotropic layered semiconductor materials. The suggested method implies the use of a four-probe testing device with a linear arrangement of probes. The final expressions for identifying the electrical conductivity are p...

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Bibliographic Details
Published in:Chinese physics letters 2015-11, Vol.32 (11), p.114-117
Main Authors: Filippov, V. V., Vlasov, A. N.
Format: Article
Language:English
Subjects:
Analytic functions
Conductivity
Crystals
Devices
Electrical resistivity
Resistivity
Semiconductor materials
Semiconductors
半导体材料
各向异性
四探针
层状晶体
测试装置
测量方法
电导率
解析函数
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Summary:We describe theoretically the grounded method of measuring the conductivity of anisotropic layered semiconductor materials. The suggested method implies the use of a four-probe testing device with a linear arrangement of probes. The final expressions for identifying the electrical conductivity are presented in the form of a series of analytic functions. The suggested method is experimentally verified, and practical recommendations of how to apply it are also provided.
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/32/11/117203