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Breaking the Speed Limits of Phase-Change Memory

Phase-change random-access memory (PCRAM) is one of the leading candidates for next-generation data-storage devices, but the trade-off between crystallization (writing) speed and amorphous-phase stability (data retention) presents a key challenge. We control the crystallization kinetics of a phase-c...

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Bibliographic Details
Published in:Science (American Association for the Advancement of Science) 2012-06, Vol.336 (6088), p.1566-1569
Main Authors: Loke, D., Lee, T. H., Wang, W. J., Shi, L. P., Zhao, R., Yeo, Y. C., Chong, T. C., Elliott, S. R.
Format: Article
Language:English
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Summary:Phase-change random-access memory (PCRAM) is one of the leading candidates for next-generation data-storage devices, but the trade-off between crystallization (writing) speed and amorphous-phase stability (data retention) presents a key challenge. We control the crystallization kinetics of a phase-change material by applying a constant low voltage via prestructural ordering (incubation) effects. A crystallization speed of 500 picoseconds was achieved, as well as high-speed reversible switching using 500-picosecond pulses. Ab initio molecular dynamics simulations reveal the phase-change kinetics in PCRAM devices and the structural origin of the incubation-assisted increase in crystallization speed. This paves the way for achieving a broadly applicable memory device, capable of nonvolatile operations beyond gigahertz data-transfer rates.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.1221561