Removing multiple outliers and single-crystal artefacts from X-ray diffraction computed tomography data

This paper reports a simple but effective filtering approach to deal with single‐crystal artefacts in X‐ray diffraction computed tomography (XRD‐CT). In XRD‐CT, large crystallites can produce spots on top of the powder diffraction rings, which, after azimuthal integration and tomographic reconstruct...

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Bibliographic Details
Published in:Journal of applied crystallography 2015-12, Vol.48 (6), p.1943-1955
Main Authors: Vamvakeros, Antonios, Jacques, Simon D. M., Di Michiel, Marco, Middelkoop, Vesna, Egan, Christopher K., Cernik, Robert J., Beale, Andrew M.
Format: Article
Language:English
Subjects:
Artefacts
Computation
Crystallites
Crystallography
Diffraction
diffraction images
diffraction tomography
Filtering
Filtration
powder X-ray diffraction
Reconstruction
Tomography
X-rays
XRD-CT
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Summary:This paper reports a simple but effective filtering approach to deal with single‐crystal artefacts in X‐ray diffraction computed tomography (XRD‐CT). In XRD‐CT, large crystallites can produce spots on top of the powder diffraction rings, which, after azimuthal integration and tomographic reconstruction, lead to line/streak artefacts in the tomograms. In the simple approach presented here, the polar transform is taken of collected two‐dimensional diffraction patterns followed by directional median/mean filtering prior to integration. Reconstruction of one‐dimensional diffraction projection data sets treated in such a way leads to a very significant improvement in reconstructed image quality for systems that exhibit powder spottiness arising from large crystallites. This approach is not computationally heavy which is an important consideration with big data sets such as is the case with XRD‐CT. The method should have application to two‐dimensional X‐ray diffraction data in general where such spottiness arises.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576715020701