High energy-resolution electron energy-loss spectroscopy and soft-x-ray emission spectroscopy studies of amorphous diamond transformed from neutron-irradiated graphite

High energy-resolution electron energy-loss spectroscopy measurements were performed for amorphous diamond (am-DIA), which was synthesized from neutron-irradiated graphite by shock compression, by using a monochromator transmission electron microscope (TEM). Soft-X-ray emission spectroscopy (SXES) m...

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Bibliographic Details
Published in:Journal of physics. Conference series 2014-05, Vol.500 (19), p.192013-5
Main Authors: Sato, Y, Terauchi, M, Niwase, K, Nakamura, K G, Atou, T, Iwata, T
Format: Article
Language:English
Subjects:
Buckminsterfullerene
Compressing
Diamonds
Electron density
Electron energy
Electron energy loss spectroscopy
Electrons
Emission analysis
Emission spectroscopy
Energy
Energy gap
Excitation
Excitation spectra
Fullerenes
Graphite
Monochromators
Physics
Spectroscopic analysis
Spectroscopy
Spectrum analysis
Synthesis
Transmission electron microscopy
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Summary:High energy-resolution electron energy-loss spectroscopy measurements were performed for amorphous diamond (am-DIA), which was synthesized from neutron-irradiated graphite by shock compression, by using a monochromator transmission electron microscope (TEM). Soft-X-ray emission spectroscopy (SXES) measurements were performed by a wavelength-dispersive type spectrometer attached to the monochromator TEM. A volume plasmon peak of am-DIA is observed at 32.5 eV, which is a little smaller than that of crystalline diamond (c-DIA). The smaller plasmon energy of am-DIA indicates a smaller valence electron density of am-DIA than that of c-DIA. From the onset energies of the K-shell excitation and the SXES spectra, the band gap energy of am-DIA is estimated to be 4 eV, which is similar to the value, 3.9 eV, from the valence electron excitation spectrum and reported values, 3.5-4.5 eV, for the am-DIA synthesized from C60 fullerene by shock compression.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/500/19/192013