Microanalysis of ambient particles from Lexington, KY, by electron microscopy

Analytical transmission electron microscopy has been used for in-depth characterization of the individual submicron (physical size

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Bibliographic Details
Published in:Atmospheric environment (1994) 2006-02, Vol.40 (4), p.651-663
Main Authors: Chen, Yuanzhi, Shah, Naresh, Huggins, Frank E., Huffman, Gerald P.
Format: Article
Language:English
Subjects:
Airborne
Ambient
Applied sciences
Atmospheric pollution
Carbonaceous
Characterization
Combustion
Exact sciences and technology
Pollutants physicochemistry study: properties, effects, reactions, transport and distribution
Pollution
TEM
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Description
Summary:Analytical transmission electron microscopy has been used for in-depth characterization of the individual submicron (physical size
ISSN:1352-2310
1873-2844
DOI:10.1016/j.atmosenv.2005.09.036