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Properties of fluorine and tin co-doped ZnO thin films deposited by sol–gel method
•F and Sn co-doped ZnO thin films were synthesized by sol–gel method.•The effects of different F doping concentrations were investigated.•The co-doped nanocrystals exhibit good crystal quality.•The origin of the photoluminescence emissions was discussed.•The films showed high transmittance and low r...
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Published in: | Journal of alloys and compounds 2013-11, Vol.576, p.31-37 |
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Main Authors: | , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | •F and Sn co-doped ZnO thin films were synthesized by sol–gel method.•The effects of different F doping concentrations were investigated.•The co-doped nanocrystals exhibit good crystal quality.•The origin of the photoluminescence emissions was discussed.•The films showed high transmittance and low resistivity.
Highly transparent and conducting fluorine (F) and tin (Sn) co-doped ZnO (FTZO) thin films were deposited on glass substrates by the sol–gel processing. The structure and morphology of the films are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and high resolution transmission electron microscopy (HRTEM) with various F doping concentrations. SEM images showed that the hexagonal ZnO crystals were well-arranged on the glass substrates and the HRTEM images indicated that the individual nanocrystals are highly oriented and exhibited a perfect lattice structure. Owing to its high carrier concentration and mobility, as well as good crystal quality, a minimum resistivity of 1×10−3Ωcm was obtained from the FTZO thin film with 3% F doping, and the average optical transmittance in the entire visible wavelength region was higher than 90%. The X-ray photoelectron spectroscopy (XPS) study confirmed the substitution of Zn2+ by Sn ions and Room temperature photoluminescence (PL) observed for pure and FTZO thin films suggested the films exhibit a good crystallinity with a very low defect concentration. |
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ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2013.04.132 |