Nanometer Scale Alignment of Block-Copolymer Domains by Means of a Scanning Probe Tip

Alignment of perpendicularly oriented lamellar block copolymer domains using an AFM tip is demonstrated. The AFM tip orients the domains through local shearing, resulting in domain alignment parallel to tip travel. AFM tips can also deposit block copolymer nanostructures on heated substrates with a...

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Bibliographic Details
Published in:Advanced materials (Weinheim) 2014-05, Vol.26 (19), p.2999-3002
Main Authors: Felts, Jonathan R., Onses, M. Serdar, Rogers, John A., King, William P.
Format: Article
Language:English
Subjects:
Alignment
Atomic force microscopy
Block copolymers
block-copolymer lithography
Blocking
Deposits
Nanostructure
Scanning
shear alignment
Shearing
tip-based nanofabrication
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Description
Summary:Alignment of perpendicularly oriented lamellar block copolymer domains using an AFM tip is demonstrated. The AFM tip orients the domains through local shearing, resulting in domain alignment parallel to tip travel. AFM tips can also deposit block copolymer nanostructures on heated substrates with a variety of experimentally observed domain alignments.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201305481