Algorithm based comparison between the integral method and harmonic analysis of the timing jitter of diode-based and solid-state pulsed laser sources

A comparison between two methods of timing jitter calculation is presented. The integral method utilizes spectral area of the single side-band (SSB) phase noise spectrum to calculate root mean square (rms) timing jitter. In contrast the harmonic analysis exploits the uppermost noise power in high ha...

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Bibliographic Details
Published in:	Optics communications 2015-04, Vol.341, p.7-14
Main Authors:	Metzger, N.K., Su, C.-R., Edwards, T.J., Brown, C.T.A.
Format:	Article
Language:	eng
Subjects:	Algorithms Fourier analysis Harmonic analysis Integrals Laser diodes Laser stabilization Mathematical analysis Mode-locked lasers Noise Noise measurement Phase noise Pulse train Pulsed laser noise Semiconductor lasers Timing jitter
Online Access:	Get full text
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Summary:	A comparison between two methods of timing jitter calculation is presented. The integral method utilizes spectral area of the single side-band (SSB) phase noise spectrum to calculate root mean square (rms) timing jitter. In contrast the harmonic analysis exploits the uppermost noise power in high harmonics to retrieve timing fluctuation. The results obtained show that a consistent timing jitter of 1.2ps is found by the integral method and harmonic analysis in gain-switched laser diodes with an external cavity scheme. A comparison of the two approaches in noise measurement of a diode-pumped Yb:KY(WO4)2 passively mode-locked laser is also shown in which both techniques give 2ps rms timing jitter. •A comparison between two methods of timing jitter calculation is presented.•The relationship and accuracy between the two methods is presented experimentally and theoretically in the same system setup.•Phase noise in a gain-switched laser diode and a passive mode-locked solid state laser are evaluated.•Noise sources in the different laser systems are discussed.•The developed algorithm will be made available to be downloaded by the reader.
ISSN:	0030-4018 1873-0310