Loading…
Buffer-free Cu(In,Ga)Se2-solar cells by near-surface ion implantation
High-efficiency Cu(In,Ga)Se2 thin-film solar cells typically include CdS buffer layers deposited in a chemical bath. In this work, Cu(In,Ga)Se2 devices are presented in which the CdS buffer layer was omitted completely. Instead, low-energy ion implantation of group-II-elements (Cd, Zn, and Mg) is ap...
Saved in:
Published in: | Solar energy materials and solar cells 2013-09, Vol.116, p.43-48 |
---|---|
Main Authors: | , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | High-efficiency Cu(In,Ga)Se2 thin-film solar cells typically include CdS buffer layers deposited in a chemical bath. In this work, Cu(In,Ga)Se2 devices are presented in which the CdS buffer layer was omitted completely. Instead, low-energy ion implantation of group-II-elements (Cd, Zn, and Mg) is applied in order to establish an n-type surface layer in p-type Cu(In,Ga)Se2 absorber layers. Therefore, thermal annealing procedures were developed which lead to a full recovery of the implantation induced defects and simultaneously minimize the diffusion of the dopants. Such a treatment is shown to provide high-quality p–n junction functionality and buffer-free Cu(In,Ga)Se2 thin-film solar cells with open-circuit voltages close to 600mV and efficiencies exceeding 10 %.
•CIGSe absorber layers were deposited on glass by a multi-stage standard process.•Inversion of the surface layer was introduced by ion implantation of Zn, Mg and Cd.•Recovery of the implantation damage and diffusion of the dopants were investigated.•Completed solar cells show high-quality p–n junction functionality.•Efficiencies of CdS buffer-free CIGSe solar cells exceeded 10%. |
---|---|
ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2013.04.009 |