Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure

We have compared the data retention of irradiated commercial NAND flash memories at different doses. Activation energies for retention testing at high temperature have also been determined.

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2012-12, Vol.59 (6), p.3011-3015
Main Authors: Oldham, T. R., Dakai Chen, Friendlich, M. R., LaBel, K. A.
Format: Article
Language:English
Subjects:
Activation energy
CMOS
CMOS technology
Flash memory (computers)
Irradiation
Nonvolatile memory
Radiation effects
Reliability
retention
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Description
Summary:We have compared the data retention of irradiated commercial NAND flash memories at different doses. Activation energies for retention testing at high temperature have also been determined.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2012.2221144