Simultaneous determination of thickness and refractive index based on time-of-flight measurements of terahertz pulse

We present a simple technique for simultaneous determination of thickness and refractive index of plane-parallel samples in the terahertz radiation domain. The technique uses time-of-flight measurements of the terahertz pulse. It has been employed on nine different polymers and semiconductor materia...

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Bibliographic Details
Published in:Applied optics (2004) 2012-07, Vol.51 (21), p.5326-5330
Main Authors: Hussain, Babar, Ahmed, Mushtaq, Nawaz, M, Saleem, M, Razzaq, M, Aslam Zia, M, Iqbal, M
Format: Article
Language:English
Subjects:
Decimals
Micrometers
Polymers
Refractive index
Refractivity
Semiconductor materials
Terahertz frequencies
Thickness measurements
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Summary:We present a simple technique for simultaneous determination of thickness and refractive index of plane-parallel samples in the terahertz radiation domain. The technique uses time-of-flight measurements of the terahertz pulse. It has been employed on nine different polymers and semiconductor materials, which are transparent for terahertz frequencies. Our results of thickness measurement are in good agreement with micrometer reading. The accuracy in the determination of refractive index is on the order of two decimal points.
ISSN:1559-128X
2155-3165
DOI:10.1364/AO.51.005326