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Experimental f″ of As at 170, 200, 250 and 300 K from the Bijvoet pairs of GaAs
Anomalous dispersion effects lead to the modification of the measured X-ray structure factors. In this work, we have determined the imaginary part of the anomalous dispersion correction terms (f″) of arsenide atom (As), through the X-ray data collected using spherical single crystal of GaAs, at vari...
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Published in: | Bulletin of materials science 2002-08, Vol.25 (4), p.325-327 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Anomalous dispersion effects lead to the modification of the measured X-ray structure factors. In this work, we have determined the imaginary part of the anomalous dispersion correction terms (f″) of arsenide atom (As), through the X-ray data collected using spherical single crystal of GaAs, at various temperatures, i.e. 170, 200, 250 and 300 K. It is stressed that more measurements off″ of the elements are needed to confirm the theoretical calculations. |
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ISSN: | 0250-4707 0973-7669 |
DOI: | 10.1007/BF02704126 |