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XRD Study of Structure Transformations in Zn–In–O Nanocomposite Thin Films Prepared by Spray Pyrolysis Method

Structure and composition of spray pyrolized thin films in ZnO–In 2 O 3 system with a relative atomic zinc content (Zn/In) in the range of 0.125–2 is investigated using X-ray diffraction analysis. These nanostructured films constitute of 1 to 5 In- and Zn-based oxide nanocrystalline phases including...

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Bibliographic Details
Published in:Physics of the solid state 2024-02, Vol.66 (2), p.31-37
Main Authors: Brinzari, V., Korotcenkov, G., Shapoval, O., Boris, I., Vatavu, S., Nika, D. L.
Format: Article
Language:English
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Summary:Structure and composition of spray pyrolized thin films in ZnO–In 2 O 3 system with a relative atomic zinc content (Zn/In) in the range of 0.125–2 is investigated using X-ray diffraction analysis. These nanostructured films constitute of 1 to 5 In- and Zn-based oxide nanocrystalline phases including In 2 O 3 (ZnO) 3 with superlattice structure and ZnO with rather unexpected rocksalt structure. The octahedral coordination of Zn atoms and practically the same Zn–O distances as in the case of In 2 O 3 facilitate a growth of ZnO rock salt on the surface of In 2 O 3 nanocrystals. The modified Williamson-Hall method is applied to determine the crystallite size and micro-strain in the predominant In 2 O 3 phase. The monotonous crystallite fineness of this phase with increase of Zn content and monotonous increase of In–Zn-based oxide crystallites is established. A mutual doping of In 2 O 3 and ZnO nanocrystallites, leading to the formation of n – n + contacts at their boundaries, has been revealed. Model representations about the influence of the nanocomposite structure of films on their electrical properties are proposed.
ISSN:1063-7834
1090-6460
DOI:10.1134/S1063783424600596